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Joint ICTP-IAEA Workshop on Advanced Synchrotron ...indico.ictp.it › event › speakers
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BEATRIX POLLAKOWSKI (Physikalisch Technische Bundesanstalt (PTB), Berlin - Germany). Buried layer and interface analysis by GIXRF-NEXAFS.
SI traceable characterization of nanomaterials by X-ray ...Technische Universität München
indico.frm2.tum.de
von B Beckhoff · — ... Bundesanstalt (PTB)) Dr Yves Kayser (Physikalisch-Technische Bundesanstalt (PTB)) Dr Beatrix Pollakowski-Herrmann (Physikalisch-Technische Bundesanstalt ...
Synchrotron Radiation based X-Ray Spectrometry for ...ICTP
indico.ictp.it
Matthias Müller, Rainer Unterumsberger, Beatrix Pollakowski and Burkhard Beckhoff. Physikalisch-Technische Bundesanstalt, Berlin.
Synchrotron Radiation to study Atomic Layer DepositionALBA Synchrotron
indico.cells.es
16:20 Speciation depth-profiling of nano-structured specimen by combined GIXRF-NEXAFS - Beatrix Pollakowski (Physikalisch-Technische Bundesanstalt).
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