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Design, Metrics, and Control of the Unpredictable–A Business Model...
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Siegfried Görlich, Infineon Technologies AG; Christof Brillert, Infineon ...
Bücher
SpringerCitations - Details Page
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... imaging of interfaces by sum-frequency generation. Mathias Flörsheimer, Christof Brillert and Harald Fuchs. Journal: Materials Science and Engineering: C, ...
ISTFA Proceedings of the 33rd International Symposium for...
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to. Jitter. and. Soft-Defects. Christof Brillert, Zhongling Qian, Christian Burmer Infineon Technologies AG, Failure Analysis, Munich, Germany christof.brillert ...
ISTFA 2010: Conference Proceedings from the 36th International...
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Zhongling Qian*, Christof Brillert, and Christian Burmer Infineon Technologies AG, Munich, Germany Yoshiyuki Yokoyama Hamamatsu Photonics Deutschland ...
ISTFA 2013: Proceedings from the 39th International Symposium for...
books.google.de
This volume features the latest research and practical data from the premier event for the microelectronics failure analysis community. The papers cover a wide...
Dokumente zum Namen
High resolution optical microscope with cardioid condenser for...
www.freepatentsonline.com
The present invention is an improved illumination system which achieves enhanced spatial resolution and contrast in the observation of small objects. The...
Chemical Imaging of Interfaces by Sum Frequency Microscopy
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Chemical Imaging of Interfaces by Sum Frequency Microscopy Mathias Flörsheimer,* Christof Brillert, and Harald Fuchs Physical Institute, University of...
Microscope illumination device and adapter therefor - Auburn...
www.freepatentsonline.com
An illumination system for a microscope, including a light source for generating light to illuminate a sample for microscopic observation, at least one...
Wissenschaftliche Veröffentlichungen
dblp: Christof Brillert
dblp1.uni-trier.de
List of computer science publications by Christof Brillert
dblp: Microelectronics Reliability, Volume 50
dblp.dagstuhl.de
Bibliographic content of Microelectronics Reliability, Volume 50
dblp: BibTeX records: Christof Brillert
dblp.uni-trier.de
List of computer science publications by BibTeX records: Christof Brillert
Veröffentlichungen allgemein
Suchergebnis: Bosch, Christof
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Christof Brillert. Veröffentlichungen von Christof Brillert zu Bosch, Christof ->. weitere Veröffentlichungen von Christof Brillert: Second-harmonic microscopy - a ...
Sonstiges
Christof Brillert
asm.confex.com
Christof Brillert. Infineon tech. AG Am Campeon Neubiberg Germany Papers: Tester Assisted Multiple Emission Microscopy · Home · Start · Browse · Browse by Day · At-A-Glance · Author Index ...
Conference Proceedings from the 35 th International Symposium for...
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ISTFA TM Conference Proceedings from the 35 th International Symposium for Testing and Failure Analysis ... (CO-CHAIR), QFI/Optometrix Christof Brillert, ...
41st International Symposium for Testing and Failure Analysis...
asm.confex.com
AG; Mr. Gerhard Borgmann, Infineon tech. AG; Wolfgang Schaller, Infineon tech. AG; Christof Brillert, Infineon tech. AG; Mr. Christian Burmer, Infineon tech. AG.
Atıf Formatları Başlık: Timing sensitivity analysis of logical nodes in ...avesis.yildiz.edu.tr › index
avesis.yildiz.edu.tr
KIYAN, Tuba, CHRISTOF BRILLERT, And CHRISTIAN BOIT. "Timing sensitivity analysis of logical nodes in scan design integrated circuits by pulsed diode laser ...
ISTFAM BED Electronic Device Failure Analysis Society ISE
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Modulated Reflectance with SIL 105 Zhongling Qian, Christof Brillert, and
Christian ...
Atıf Formatları Başlık: Timing Characterization of a Tester Operated ...avesis.yildiz.edu.tr › index
avesis.yildiz.edu.tr
KIYAN, Tuba, CHRISTOF BRILLERT, And CHRISTIAN BOIT. "Timing Characterization of a Tester Operated Integrated Circuit by Continuous and Pulsed Laser ...
Contents. IPFA Best Paper - PDF Free Download
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... Christof Brillert 2, and Christian Boit 3 (1) Yildiz Technical University, ... Applications in Failure Analysis Zhongling Qian 1, Christof Brillert 1, ...
Chemical imaging of interfaces by sum-frequency generation - PDF Free...
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A sum-frequency microscope is described which provides chemically and conformationally resolved infrared information wit...
IPFA TECHNICAL PROGRAM July - PDF Free Download
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... USA Spectral Gated Imaging of Dynamic Photon Emission in Mixed-Signal and Power Devices Zhongling Qian and Christof Brillert Infineon Technologies, ...
IPFA TECHNICAL PROGRAM PDF Free Downloadpdffox.com › ipfa technical-program-16-pdf-...
pdffox.com
... of Dynamic Photon Emission in Paper ID: 267 Mixed-Signal and Power Devices (7A.6) Zhongling Qian and Christof Brillert Infineon Technologies, Germany
Phoenix, Arizona, USA. shaped material interdiffusion (Al-Si) could...
hobbydocbox.com
... Dynamically Operating Mixed-Signal IC Devices 217 Zhongling Qian, Christof Brillert, and Christian Burmer, Infineon Technologies AG, Munich, Germany xiii.
Optical Localization Techniques Workshop - PDF Free Download
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3 Monday 26 January 9:00-9:45 Welcome coffee and registration Opening session : - Philippe Perdu (CNES) / CCT MCE 9:45-10:00 - Christian Boit (TU Berlin) / EUFANET - Sylvain Dudit (ST) / ANADEF TOD working group - FREESCALE / TOLSA Session 1 : Static Emission microscopy (Chairman Christof Brillert, ...
Timing analysis of scan design integrated circuits using stimulation...
www.infona.pl
This paper presents a new timing analysis methodology for clock driven scan design integrated circuits, based on externally triggered pulsed laser stimulation....
Microelectronics Reliability - researchr journal
researchr.org
1327, --, 1332, Tuba Kiyan, Christof Brillert, Christian Boit. Timing analysis of scan design integrated circuits using stimulation by an infrared diode laser in ...
Optical Localization Techniques Workshop - eufanet - PDFHALL.COM
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It will be a workshop, not a conference, and a friendly event focused on practical ... Lab tour duration is around 1 hou...
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