Fabian Haake und Joan Sendra - Info zur Person

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Fritz HaakeInspire HEP

inspirehep.net

... Mapping. #1. Joan Sendra. ,. Fabian Haake. ,. Micha Calvo. ,. Henning Galinski. ,. Ralph Spolenak. (Feb 8, 2023). e-Print: [physics.optics]. pdf cite ... Mapping. #1. Joan Sendra. ,. Fabian Haake. ,. Micha Calvo. ,. Henning Galinski. ,. Ralph Spolenak. (Feb 8, 2023). e-Print: [physics.optics]. pdf cite

Henning GalinskiInspire HEP

inspirehep.net

— #1. Joan Sendra. ,. Fabian Haake. ,. Micha Calvo. ,. Henning Galinski. ,. Ralph Spolenak. (Feb 8, 2023). e-Print: [physics.optics] — #1. Joan Sendra. ,. Fabian Haake. ,. Micha Calvo. ,. Henning Galinski. ,. Ralph Spolenak. (Feb 8, 2023). e-Print: [physics.optics].

Enhanced Ferromagnetism and Tunable Magnetism in Fe ACS Publications

pubs.acs.org

von X Hu · · Zitiert von: 103 — Joan Sendra, Fabian Haake, Micha Calvo, Henning Galinski, Ralph Spolenak. Multi‐Material Strain Mapping with Scanning Reflectance Anisotropy ... von X Hu · · Zitiert von: 103 — Joan Sendra, Fabian Haake, Micha Calvo, Henning Galinski, Ralph Spolenak. Multi‐Material Strain Mapping with Scanning Reflectance Anisotropy ...

Scanning Reflectance Anisotropy Microscopy for Multi- ...arXiv

arxiv.org

von J Sendra · — Title:Scanning Reflectance Anisotropy Microscopy for Multi-Material Strain Mapping. Authors:Joan Sendra, Fabian Haake, Micha Calvo, Henning ... von J Sendra · — Title:Scanning Reflectance Anisotropy Microscopy for Multi-Material Strain Mapping. Authors:Joan Sendra, Fabian Haake, Micha Calvo, Henning ...

DS 21: Optical Analysis of Thin Films - dpg-verhandlungen.de

www.dpg-verhandlungen.de

WEBping of Metasurfaces and Beyond — ∙Fabian Haake, Joan Sendra,Henning Galinski,andRalph Spolenak —ETHZurich, Zurich,Switzerland A common failure mode …

Origami and Kirigami Nanocomposites | ACS NanoACS Publications

pubs.acs.org

von L Xu · · Zitiert von: 205 — Joan Sendra, Fabian Haake, Micha Calvo, Henning Galinski, Ralph Spolenak. Multi‐Material Strain Mapping with Scanning Reflectance Anisotropy ... von L Xu · · Zitiert von: 205 — Joan Sendra, Fabian Haake, Micha Calvo, Henning Galinski, Ralph Spolenak. Multi‐Material Strain Mapping with Scanning Reflectance Anisotropy ...

Berlin – scientific programme - DPG-Verhandlungendpg-verhandlungen.de

www.dpg-verhandlungen.de

Scanning Reflectance Anisotropy Microscopy: Strain Mapping of Metasurfaces and Beyond — •Fabian Haake, Joan Sendra, Henning Galinski, and Ralph Spolenak — ETH ... Scanning Reflectance Anisotropy Microscopy: Strain Mapping of Metasurfaces and Beyond — •Fabian Haake, Joan Sendra, Henning Galinski, and Ralph Spolenak — ETH ...

DS 21: Optical Analysis of Thin Films - DPG-Verhandlungendpg-verhandlungen.de

www.dpg-verhandlungen.de

DS 21.8, Scanning Reflectance Anisotropy Microscopy: Strain Mapping of Metasurfaces and Beyond — •Fabian Haake, Joan Sendra, Henning Galinski, and Ralph ... DS 21.8, Scanning Reflectance Anisotropy Microscopy: Strain Mapping of Metasurfaces and Beyond — •Fabian Haake, Joan Sendra, Henning Galinski, and Ralph ...

Scanning Reflectance Anisotropy Microscopy Papers With Codepaperswithcode.com › paper › scanning-reflectance-...

paperswithcode.com

Scanning Reflectance Anisotropy Microscopy for Multi-Material Strain Mapping. 8 Feb · Joan Sendra, Fabian Haake, Micha Calvo, Henning Galinski, ...

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Fabian Haake und Joan Sendra Person-Info