Hartmut Lackner und Florian Wartenberg - Info zur Person

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Testing Software and Systems: 27th IFIP WG 6.1 International ...google.co.jp

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86 Stephan Weißleder, Florian Wartenberg, and Hartmut Lackner Monitoring and Fault Localization Guiding Testers' Hands in Monitoring Tools: Application of ...

Table of Contents - ieeecomputer.orgieeecomputer.org

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von M Papadakis — Hartmut Lackner, Martin Thomas, Florian Wartenberg, and Stephan Weißleder v. Page 2. Session 3: Data Flow and Concurrency. Detecting Concurrency Errors in ... › icst

Automated Test Design for Boundaries of Product Line Variants - Inriainria.hal.science › hal

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Automated Test Design for Boundaries of Product Line Variants. Stephan Weissleder (1) , Florian Wartenberg (1) , Hartmut Lackner (2). Afficher plus de détails.

Automated Test Design for Boundaries of Product Line Variants - IFIPifip.hal.science › hal

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Stephan Weissleder 1 Florian Wartenberg 1 Hartmut Lackner 2. Details. 1 Thales Transportation Systems [Berlin]. 2 Humboldt University Of Berlin.

Automated Test Design for Boundaries of Product Line Variantsspringer.com

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von S Weißleder · · Zitiert von: 6 — Automated Test Design for Boundaries of Product Line Variants. Stephan Weißleder,; Florian Wartenberg &; Hartmut Lackner. › chapter

IEEE Seventh International Conference on Software Testing ...researchr.org

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[doi] · Model-Based Test Design of Product Lines: Raising Test Design to the Product Line LevelHartmut Lackner, Martin Thomas, Florian Wartenberg, ...

Testing Software and Systems - Springer Linklink.springer.com › book

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39,99 $Automated Test Design for Boundaries of Product Line Variants. Stephan Weißleder, Florian Wartenberg, Hartmut Lackner. Pages Monitoring and Fault ,99 $ Automated Test Design for Boundaries of Product Line Variants. Stephan Weißleder, Florian Wartenberg, Hartmut Lackner. Pages Monitoring and Fault ...

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Hartmut Lackner und Florian Wartenberg Person-Info

Testing Software and Systems: 27th IFIP WG 6.1 International ...google.co.jp

Table of Contents - ieeecomputer.orgieeecomputer.org

Automated Test Design for Boundaries of Product Line Variants - Inriainria.hal.science › hal

Automated Test Design for Boundaries of Product Line Variants - IFIPifip.hal.science › hal

Automated Test Design for Boundaries of Product Line Variantsspringer.com

IEEE Seventh International Conference on Software Testing ...researchr.org

Testing Software and Systems - Springer Linklink.springer.com › book

Automated Test Design for Boundaries of Product Line ...LAAS-CNRS

Automated Test Design for Boundaries of Product Line Variantshal.in2p3.fr › IFIP-LNCS › hal

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[PDF] A general approach to Software Product Line testing - idUSidus.us.es › bitstream › handle

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