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Jansuz Rajskis berufliches Profil anzeigen LinkedIn ist das weltweit größte professionelle Netzwerk, das Fach- und Führungskräften wie Jansuz Rajski dabei ...

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MENTOR GRAPHICS CORPORATION, Horton, DE

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Jansuz Rajski | LinkedIn

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EP A1 - Weighted random pattern testing apparatus and method...

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US B Jansuz Rajski Continuous application and decompression of test patterns to a circuit-under-test. US B2 ...

US A - Self-diagnosable integrated circuit device capable of...

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In a self-diagnosable integrated circuit device comprising sequential circuit elements in an internal logic circuit, a first test pattern signal is...

US A1 - Arithmetic built-in self-test of multiple...

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In one embodiment, an IC with an embedded processor core, peripheral devices, and associated multiple scan chains, is provided with microcode that...

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US A - Fast bist architecture with flexible standard interface...

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A built-in self test architecture for testing one or more integrated circuits. Each circuit is provided with an interface compatible with IEEE standard...

US A - Circuit with built-in test and method thereof

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US , 20 Jul 2000, 17 Feb 2009, Jansuz Rajski, Continuous application and decompression of test patterns to a circuit-under-test. US *, 25 Oct ...

US A - Memory device containing a static ram memory that is...

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A memory device that contains a static RAM memory is provided with data input and data output registers, an address register, and a control register for...

US A - Pseudo-random noise series generator Google...

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A pseudo-random noise series generator which can change the timing of generation of a PN series arbitrarily and with no instantaneous cut-off of the...

US A - Testable programmable gate array and associated...

patents.google.com

A programmable gate array includes test subsystems for testing various functional subsystems of the programmable gate array. A sequence of test methods,...

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