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ESREF Poster Presentations Tue
conference.vde.com
Poster Presentations Tuesday ESREF Georg Michael Reuther, Reinhard Pufall, Michael Goroll Infineon Technologies AG, Germany Tue-Expo-17:30-P16 High resolution imaging of dopant and depletion layer distributions in SiC power MOSFET using super-higher-order nonlinear dielectric microscopy
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