Michael Goroll und Reinhard Pufall - Info zur Person

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ESREF Poster Presentations Tue

conference.vde.com

Poster Presentations Tuesday ESREF Georg Michael Reuther, Reinhard Pufall, Michael Goroll Infineon Technologies AG, Germany Tue-Expo-17:30-P16 High resolution imaging of dopant and depletion layer distributions in SiC power MOSFET using super-higher-order nonlinear dielectric microscopy

Physics-of-Failure Based Handbook of Microelectronic Systems -...

books.google.de

Michael Goroll, Reinhard Pufall, Werner Kanert, Boris Plikat, “Semiconductor in High Temperature Applications-A Future trend in Automotive Industry”, ...

ScienceDirect.com

www.sciencedirect.com

von M Goroll · · Zitiert von: 10 — ... of power devices. Author links open overlay panel. Michael Goroll , Reinhard Pufall. Show more. Add to Mendeley. Share. Cite. https://doi.org j.microrel ...

DBLPhttps://dblp.uni-trier.de › pidRainer Dudek

dblp.uni-trier.de

AP — Reinhard Pufall, Michael Goroll, Joachim Mahler, Werner Kanert, M. Bouazza, Olaf Wittler, Rainer Dudek: Degradation of moulding compounds ...

M. Bouazza - dblpdblp.uni-trier.de › Persons

dblp.uni-trier.de

Reinhard Pufall, Michael Goroll, J. Mahler, Werner Kanert, M. Bouazza, Olaf Wittler, Rainer Dudek: Degradation of moulding compounds during ...

dblp: Reinhard Pufall

dblp.org

List of computer science publications by Reinhard Pufall

AI Chat for scientific PDFs

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Reuther 1, Michael Goroll 1, Dominik Udiljak 1, Reinhard Pufall 1, Bernhard Wunderle 2 - Show less +2 more • Institutions (2). Infineon Technologies

Academia.edu

www.academia.edu

... power devices Michael Goroll *, Reinhard Pufall Inﬁneon Technologies AG, Reliability Methodology Department, Otto-Hahn-Ring 6, D Munich, Germany ...

Dialnet

dialnet.unirioja.es

Reuther, Michael Goroll, Dominik Udiljak, Reinhard Pufall, Bernhard Wunderle · Resumen. págs Artículo. Study of wire bonding reliability of Ag-Pd-Au ...

EuroSimE 2024

www.eurosime.org

Design of robust packages by deliberate release of elastic energy to avoid interfacial crack propagation. Reinhard Pufall 1, Michael Goroll, 1, Georg M.

Accelerated Reliability Testing for Power Semiconductor Packages -...

www.asminternational.org

Author: Michael Goroll and Reinhard Pufall, Infineon Technologies AG, Neubiberg | Document Download | Product code: ZEDFA1504P22.

Microelectronics Reliability - researchr journal

researchr.org

1310, --, 1312, Stefano Aresu, Reinhard Pufall, Michael Goroll, Wolfgang Gustin. NBTI on smart power technologies: A detailed analysis of two concurrent effects ...

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Michael Goroll und Reinhard Pufall Person-Info