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Soft Error Rates in 65nm SRAMs – Analysis of new Phenomena

www.assembla.com

Soft Error Rates in 65nm SRAMs – Analysis of new Phenomena Franz X. Ruckerbauer, Georg Georgakos* Infineon Technologies AG Otto-Hahn-Ring 6, Munich, Germany

Franz X. Ruckerbauer

academic.research.microsoft.com

The information is calculated based on the tens of millions of scholarly ... Franz X. Ruckerbauer, Georg Georgakos

DBLP: Franz X. Ruckerbauer

www.informatik.uni-trier.de

Franz X. Ruckerbauer, Georg Georgakos: Soft Error Rates in 65nm SRAMs--Analysis of new Phenomena. IOLTS 2007:

IOLTS 2007

dblp.dagstuhl.de

Franz X. Ruckerbauer, Georg Georgakos: Soft Error Rates in 65nm SRAMs--Analysis of new Phenomena Electronic Edition ...

Improving cache lifetime reliability at ultra-low voltages

portal.acm.org

Franz X. Ruckerbauer , Georg Georgakos, Soft Error Rates in 65nm SRAMs--Analysis of new Phenomena, Proceedings of the 13th IEEE International On-Line Testing Symposium, p

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