Thomas Längle und Jürgen Beyerer - Info zur Person

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KIT Scientific Publishing

www.ksp.kit.edu

Jürgen Beyerer (Hrsg.), Fernando Puente León, Thomas Längle (Hrsg.) OCM Optical Characterization of Materials - conference proceedings (OCM - International Conference on Optical Characterization of Materials : Conference Proceedings ; 2013)

Articles - IS&T | Library - Society for Imaging Science and Technologylibrary.imaging.org › articles › art00022

library.imaging.org

Johannes Meyer, Robin Gruna, Thomas Längle, Jürgen Beyerer, "Simulation of an Inverse Schlieren Image Acquisition System for Inspecting Transparent Objects" ...

Volume 86 Issue Forum Bildverarbeitung De Gruyterwww.degruyter.com › journal › key › teme › html

www.degruyter.com

Thomas Längle, Fernando Puente León, Michael Heizmann. Page range: Christian Negara, Thomas Längle, Jürgen Beyerer. Page range:

at - Automatisierungstechnik Band 65 Heft 6 - Special Issue:...

www.degruyter.com

Florian Pfaff, Georg Maier, Mikhail Aristov, Benjamin Noack, Robin Gruna, Uwe D. Hanebeck, Thomas Längle, Jürgen Beyerer, Christoph Pieper, ...

OSA | Programmable light source based on an echellogram of a...

opg.optica.org

Programmable light source based on an echellogram of a supercontinuum laser. Ding Luo, Miro Taphanel, Thomas Längle, and Jürgen Beyerer.

Thomas Längle - DBLPdblp.org › Persons

dblp.org

Georg Maier, Anja Shevchyk, Merle Flitter, Robin Gruna, Thomas Längle, Uwe D. Hanebeck, Jürgen Beyerer: Motion-based visual inspection of optically ...

Automatic visual inspection based on trajectory data - CORE

core.ac.uk

Automatic visual inspection based on trajectory data. By Georg Maier, N. Mürdter, Robin Gruna, Thomas Längle and Jürgen Beyerer ...

SNR-optimized image fusion for transparent object inspection | (2018)...

spie.org

Thomas Längle, Fraunhofer-Institut für Optronik, Systemtechnik und Bildauswertung (Germany) Jürgen Beyerer, Fraunhofer-Institut für Optronik, ...

Automatic visual inspection based on trajectory data

publikationen.bibliothek.kit.edu

OCM : 4th International Conference on Optical Characterization of Materials : March 13th - 14th, : Karlsruhe, Germany / edited by Jürgen Beyerer, Fernando Puente Léon, Thomas Längle: Veranstaltung: 4th International Conference on Optical Characterization of Materials (2019), Karlsruhe, Deutschland, – : Verlag

Fig. 3.opg.optica.org › viewmedia

opg.optica.org

Citation. Chia-Wei Chen, Matthias Hartrumpf, Thomas Längle, Jürgen Beyerer, "Analytical determination of the complex refractive index and the incident angle ...

AMS Publications

www.ams.ovgu.de

Georg Maier, Florian Pfaff, Andrea Bittner, Robin Gruna, Benjamin Noack, Harald Kruggel-Emden, Uwe D. Hanebeck, Thomas Längle, Jürgen Beyerer.

Create a SciFeed alert for new publications - MDPIwww.mdpi.com › scifeed_display

www.mdpi.com

By following authors. Moritz Beck. Georg Maier. Merle Flitter. Robin Gruna. Thomas Längle. Michael Heizmann. Jürgen Beyerer ...

ICIAR Program Details

www.aimiconf.org

246, Gaussian Mixture Trees for One Class Classification in Automated Visual Inspection, Matthias Richter, Thomas Längle, Jürgen Beyerer, Oral. 269, Input ...

[PDF] Fig. 13.www.osapublishing.org › viewmedia

www.osapublishing.org

Citation. Ding Luo, Miro Taphanel, Thomas Längle, Jürgen Beyerer, "Programmable light source based on an echellogram of a supercontinuum laser," Appl. Opt.