Ulrich Schiebel und Inventors - Info zur Person

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US Patent for Device for producing x-ray images by means of a...

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Inventors: Walter Hillen (Aachen), Peter Quadflieg (Aachen), Ulrich Schiebel (Aachen) Primary Examiner: Craig E. Church Attorney, Agent or ...

US Patent for Method and apparatus for producing an X-ray image by...

patents.justia.com

Filed: Aug 8, Date of Patent: Jun 21, Assignee: U.S. Philips Corporation (New York, NY) Inventors: Norbert Conrads (Hauset), Walter Hillen (Aachen), Peter J. Quadflieg (Aachen), Ulrich Schiebel (Aachen) Primary Examiner: Carolyn E. Fields Assistant Examiner: Joseph A. Hynds Attorney, Agent or Firm: Jack E.

US Patent for X-ray detector with charge pattern read-out by TFT...

patents.justia.com

Patent History. Patent number: Type: Grant Filed: Feb 15, Date of Patent: Nov 29, Assignee: U.S. Philips Corporation (New York, NY) Inventors: Gerardus Van Aller (Heerlen), Ulrich Schiebel (Aachen) Primary Examiner: David C. Nelms Attorney: Jack D. Slobod Application Number: ,

US Patent for X-ray examination apparatus including a matrix of...

patents.justia.com

Type: Grant Filed: Nov 7, Date of Patent: Mar 16, Assignee: U.S. Philips Corp. (New York, NY) Inventors: Hendrik J. Meulenbrugge (Veldhoven), Ulrich Schiebel (Aachen), Herfried Wieczorek (Aachen) Primary Examiner: Carolyn E. Fields Attorney, Agent or Firm: Jack D. Slobod Application Number: ,

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Person "Schiebel" (3)
Vorname "Ulrich" (33433)
Name "Schiebel" (411)

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Ulrich Schiebel und Inventors Person-Info

US Patent for Device for producing x-ray images by means of a...

US Patent for Method and apparatus for producing an X-ray image by...

US Patent for X-ray detector with charge pattern read-out by TFT...

US Patent for X-ray examination apparatus including a matrix of...