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39th International Conference on Vacuum Ultraviolet and X-ray Physics...
indico.psi.ch
VUVX International Science Committee Regular VUVX ISC Members: Fred Bijkerk The Netherlands Majed Chergui Switzerland Reinhard Doerner Germany
FOM-prijs voor UT-onderzoeker Slava Medvedev - U-Today
www.utoday.nl
Promotor en begeleider Fred Bijkerk nomineerde Medvedev. Hij zegt blij verrast te zijn met de prijs van euro voor zijn toenmalige ...
Outline iMNC2018 | Micronano
www.micronanoconference.org
General information Name event International MicroNanoConference Aim Connect science and industry in the micro nano area Themes All themes are represented
Top nanotechnology group relocates to University of Twente
www.nanowerk.com
— The entire nanolayer Surface and Interface physics (nSI) department, headed by Professor Fred Bijkerk, which is currently located at FOM's ... › news
Netzwerk-Profile
LinkedIn: Fred Bijkerk - Enige eigenaar • 1st - ByCare | LinkedIn
Bekijk het profiel van Fred Bijkerk op LinkedIn, de grootste professionele community ter wereld. Fred Bijkerk heeft 5 functies op zijn of haar profiel. Bekijk het ...
LinkedIn: Fred Bijkerk | Professioneel profiel - LinkedIn
Bekijk het profiel van Fred Bijkerk op LinkedIn, de grootste professionele community ter wereld. Fred Bijkerk heeft 4 banen vermeld op zijn of haar profiel. Bekijk het volledige profiel op LinkedIn om de connecties van Fred Bijkerk en vacatures bij vergelijkbare bedrijven te zien.
Недостаје: shuiro
LinkedIn: Fred Bijkerk | Professioneel profiel - LinkedIn
Bekijk het professionele profiel van Fred Bijkerk op LinkedIn. LinkedIn is het grootste zakelijke netwerk ter wereld en stelt professionals als Fred Bijkerk in staat ...
LinkedIn: Fred Bijkerk | LinkedIn
LinkedIn is the world's largest business network, helping professionals like Fred Bijkerk discover inside connections to recommended job candidates, industry ...
Interessen
Action P14 - COST
www.cost.eu
Netherlands, Dr Fred BIJKERK. Poland, Prof. Jerzy WOLOWSKI. Portugal, Prof José Tito MENDONCA. Romania, Prof. Viorica FLORESCU.
Business-Profile
patentbuddy: Fred Bijkerk
CARL ZEISS GMBH
Ausbildung
Low-Z element analysis by soft X-ray line emission of a laser ...journals.scholarsportal.info › 503_leabsxleoalp
journals.scholarsportal.info
Authors. Hedser Van Brug · Fred Bijkerk · Marnix J. van der Wiel · Bob van Wingerden. Source Information. January 1987, Volume2(Issue5)Pages, p.503To
Schlechte Nachrichten
Online Familieberichten; Naamindex met achternamen beginnend met BIJK
www.online-familieberichten.nl
Naamindex met achternamen beginnend met BIJK, Project voor het vastleggen van online familieberichten. Overlijdensadvertenties, Bidprentjes enz.
Bücher
外文检索-中国知网
scholar.cnki.net
CNKI学术搜索是一个基于海量资源的跨学科、跨语种、跨文献类型的学术资源搜索平台，其资源库涵盖各类学术期刊、论文、报纸、专利、标准、年鉴、工具书等，旨在为国内外研究人员提供全面、权威、系统的知识网络。
EUV Lithography - Vivek Bakshi - Google Books
books.google.de
... E. W. J. van der Drift. FOM: Fred Bijkerk, Eric Louis, Alexander Mitrofanov, Eric Puik, R. Schlat- mann, Leonid Shmaenok, Marnix van der Wiel, A. van ...
EUV Sources for Lithography - Google Books
books.google.de
Fred Bijkerk obtained a Ph.D. in experimental physics at the Free University Amsterdam ( ) . His thesis described the application of a laser plasma source ...
Laser Induced Damage in Optical Materials: Proceedings of a Symposium...
books.google.de
2810 Wilderness Place , #B Boulder , CO Fred Bijkerk FOM - Institute for Plasma Physics Rijnhuizen , P.O. Box BE Nieuwegein ...
Dokumente zum Namen
Fred Bijkerk - Academia.edu
independent.academia.edu
Academia.edu is a place to share and follow research.
Limits of surface analysis of thin film compounds using LEIS
arxiv.org
von AA Zameshin · · Zitiert von: 1 — Authors:Andrey A. Zameshin, Andrey E. Yakshin, Jacobus M. Sturm, Cristiane Stilhano Vilas Boas, Fred Bijkerk. › cond-mat
Phys. Rev. Lett. 56, 655 (1986) - Pulsed-laser irradiated silicon...
journals.aps.org
Silicon Studied by Time-Resolved X-Ray Absorption ( eV). Kouichi Murakami, t'~. Hans C. Gerritsen, Hedser van Brug,Fred Bijkerk, Frans W. Saris, and.
[ ] Ellipsometry with an undetermined polarization state
arxiv.org
Authors: Feng Liu, Chris J. Lee, Juequan Chen, Eric Louis, Peter J. M. van der Slot, Klaus J. Boller, Fred Bijkerk. (Submitted on 18 Oct 2011). Abstract: We show ...
Veröffentlichungen allgemein
Stress Reduction in Multilayers Used for X-Ray and Neutron Optics ...link.springer.com › chapter
link.springer.com
Authors; Authors and affiliations. Thomas Krist; Anke Teichert; Evgeni Meltchakov ; Vladimir Vidal; Erwin Zoethout; Stephan Müllender; Fred Bijkerk. Thomas Krist.
Stress Reduction in Multilayers Used for X-Ray and Neutron ...
link.springer.com
von T Krist · · Zitiert von: 1 — Stephan Müllender &; Fred Bijkerk. Show authors. Chapter Accesses. Part of the Springer Series in optical science book series (SSOS,volume 137). › chapter
Stress Reduction in Multilayers Used for X-Ray and Neutron Optics |...
link.springer.com
Multilayer systems have important applications in many areas of X-ray and neutron optics. For some applications the positions of the optical surfaces have to...
Artikel & Meinungen
fom - Dutch translation – Linguee
www.linguee.com
Dr. Fred Bijkerk, is still a part of the FOM Institute, but will relocate to Twente with ... Fred Bijkerk is nu nog onderdeel van het FOM instituut, maar zal gesteund ...
group of Prof - Nederlandse vertaling – Linguee woordenboek
www.linguee.nl
▾. Externe bronnen (Nederlands) · This group, headed by Prof. Dr. Fred Bijkerk, is still a part of the FOM Institute, [...] but will relocate to Twente with the. › engels-nederlands › group+of...
euv light - Nederlandse vertaling – Linguee woordenboek
www.linguee.nl
Fred Bijkerk was able to directly utilise his scientific results for the development and. [...] production of EUV optics for industrial [...] applications. fom.nl. fom.nl.
Tuning of large piezoelectric response in nanosheet-buffered lead...
www.nature.com
von A Chopra · · Zitiert von: 9 — Fred Bijkerk &; Guus Rijnders. Show authors. Scientific Reports volume 7, Article number: 251 (2017) Cite this article Accesses. › articles
Sonstiges
Fred Bijkerk | LinkedIn
www.linkedin.com
View Fred Bijkerk's professional profile on LinkedIn. LinkedIn is the world's largest business network, helping professionals like Fred Bijkerk discover inside ...
Online Familieberichten; Overleden: Fred Bijkerk ( )
www.online-familieberichten.nl
Overleden: Fred Bijkerk ( ), Project voor het vastleggen van online familieberichten. Overlijdensadvertenties, Bidprentjes enz.
Mo/Si multilayer‐coated amplitude‐division beam splitters for XUV...
www.chemeurope.com
Amplitude‐division beam splitters for XUV radiation sources have been developed and extensively characterized. Mo/Si multilayer coatings were deposited on...
Enhancement of laser plasma EUV emission by shockwave–plasma...
www.tib.eu
Author / Creator: René de Bruijn ; Konstantin Koshelev ; Fred Bijkerk. Abstract: Laser plasmas have been produced using a xenon gas jet as a targ... More.
(IUCr) Mo/Si multilayer-coated amplitude-division beam splitters for...
journals.iucr.org
... * Robbert W. E. van de Kruijs, a Eric Louis, a Gisela von Blanckenhagen, c Eric M. Gullikson, d Frank Siewert, e Andrzej Wawro b and Fred Bijkerk a, f. a FOM ...
"Improved burst pressure of LPCVD Si3N4 membranes by ...
dc.engconfintl.org
von A Shafikov · — Please click Additional Files below to see the full abstract. Recommended Citation. Airat Shafikov, Bart Schurink, Robbert van de Kruijs, and Fred Bijkerk, " ... › nanoch...
(PDF) Microstructure of Mo/Si multilayers with B_4C diffusion barrier...
www.academia.edu
Microstructure of Mo/Si multilayers with B_4C diffusion barrier layers
100-Hz KrF laser plasma x-ray sourcedx.doi.org › Proceedings › Volume 1503
www.spiedigitallibrary.org
I. C. Edmond Turcu, Malcolm C. Gower, C. J. Reason, P. Huntington, M. Schulz, Alan G. Michette, Fred Bijkerk, Eric Louis, Gregory J. Tallents, Yas Al-Hadithi, ...
Absolute calibration of a multilayer-based XUV diagnosticwww.infona.pl › resource
www.infona.pl
Absolute calibration of a multilayer-based XUV diagnostic. Remko Stuik, Frank Scholze, Johannes Tümmler, Fred Bijkerk · Details · Contributors · Fields of ...
Control of defects in EUV multilayers and demonstration of at ...
www.spiedigitallibrary.org
von E Louis · · Zitiert von: 2 — Eric Louis, Mark J. H. den Hartog, Edward L. G. Maas, and Fred Bijkerk "Control of defects in EUV multilayers and demonstration of at-wavelength defect ... › ...
Controlled growth of PbZr0.52Ti0.48O3 using nanosheet coated Si ...www.infona.pl › resource
www.infona.pl
Fred Bijkerk. Industrial Focus Group XUV Optics, MESA+ Research Institute for Nanotechnology, University of Twente, PO Box 217, AE, Ens…
In situ and real-time monitoring of structure formation during ...
journals.iucr.org
von B Krause · · Zitiert von: 8 — Bärbel Krause, Dmitry S. Kuznetsov, Andrey E. Yakshin, Shyjumon Ibrahimkutty, Tilo Baumbach and Fred Bijkerk. aInstitut für Photonenforschung und ... ›
Int. Advisory Board - Pals | Prague Asterix Laser System
www.pals.cas.cz
Fred Bijkerk. FOM-Institute for Plasma Physics, Rijnhuisen, Nieuwegein. The Netherlands. Jonathan Robert Davies. Instituto Superior Técnico, GoLP/IPFN, ... › laboratory
Molecular Dynamics Simulations of Growth and Low-Energy Ion ...www.cambridge.org › core › journals › article › div...
www.cambridge.org
Published online by Cambridge University Press: 10 February Peter Klaver ,. Wim Goedheer ,. Fred Bijkerk and. Barend J. Thijsse. Show author details ...
Bijkerk - Patent applications
www.patentsencyclopedia.com
Fred Bijkerk, Bosch En Duin NL. Patent application number, Description, Published , REFLECTIVE OPTICAL ELEMENT FOR EUV ...
Low-Z element analysis by soft X-ray line emission of a...
pubs.rsc.org
A method for the rapid detection of low- elements in solid samples is presented. The detection is performed by measuring the characteristic soft X-ray line...
Nanoscale Transition Metal Thin Films: Growth PubMedpubmed.ncbi.nlm.nih.gov › ...
pubmed.ncbi.nlm.nih.gov
Authors. Anirudhan Chandrasekaran , Robbert W E van de Kruijs , Jacobus M Sturm , Andrey A Zameshin , Fred Bijkerk. Affiliation. 1 Industrial Focus Group XUV ...
Microdroplet-tin plasma sources of EUV radiation driven by ...
research.vu.nl
von OO Versolato · — ... Alexander Klein, James Byers Muharrem Bayraktar, Fred Bijkerk, Marcelo Ackermann, Aneta Stodolna, Alexander Windberger, Hendrik Bekker, ... › publications
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