Fred Bijkerk - Dokumente zum Namen - alle Infos bei Yasni.de

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Fred Bijkerk - Academia.edu

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Limits of surface analysis of thin film compounds using LEIS

arxiv.org

von AA Zameshin · · Zitiert von: 1 — Authors:Andrey A. Zameshin, Andrey E. Yakshin, Jacobus M. Sturm, Cristiane Stilhano Vilas Boas, Fred Bijkerk. › cond-mat

Phys. Rev. Lett. 56, 655 (1986) - Pulsed-laser irradiated silicon...

journals.aps.org

Silicon Studied by Time-Resolved X-Ray Absorption ( eV). Kouichi Murakami, t'~. Hans C. Gerritsen, Hedser van Brug,Fred Bijkerk, Frans W. Saris, and.

[ ] Ellipsometry with an undetermined polarization state

arxiv.org

Authors: Feng Liu, Chris J. Lee, Juequan Chen, Eric Louis, Peter J. M. van der Slot, Klaus J. Boller, Fred Bijkerk. (Submitted on 18 Oct 2011). Abstract: We show ...

[ ] Tuning of large piezoelectric response in...

arxiv.org

Authors: Anuj Chopra, Muharrem Bayraktar, Maarten Nijland, Johan E. ten Elshof , Fred Bijkerk, Guus Rijnders. (Submitted on 17 Nov 2016). Abstract: Renewed interest has been witnessed in utilizing the piezoelectric response of (PZT) films on glass substrates for applications such as data storage and adaptive optics.

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Dokumente zum Namen Fred Bijkerk

Fred Bijkerk - Academia.edu

Limits of surface analysis of thin film compounds using LEIS

Phys. Rev. Lett. 56, 655 (1986) - Pulsed-laser irradiated silicon...

[ ] Ellipsometry with an undetermined polarization state

[ ] Tuning of large piezoelectric response in...