Ullrich Pietsch - Veröffentlichungen allgemein

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Norm-Minimized Scattering Data from Intensity Spectra

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We apply the

Kinematic light scattering by 3D photonic crystals - SPIE

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— Ullrich Pietsch and Björn Brüser. In 1912, Max von Laue discovered that illumination of a natural crystal with polychromatic x-rays results ... › news

High-Resolution X-Ray Scattering | Ullrich Pietsch - Springer

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During the last 20 years interest in high-resolution x-ray diffractometry and reflectivity has grown as a result of the development of the semiconductor industry ...

Kinematic light scattering by 3D photonic crystals

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Laue scattering of visible light with an internal refractive-index contrast of less than 1% shows that kinematic-scattering theory is applicable.

High-Resolution X-Ray Scattering - SpringerLink

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von U Pietsch · Zitiert von: 731 — X-Ray Scattering by Artificially Lateral Semiconductor Nanostructures. Ullrich Pietsch, Václav Holý, Tilo Baumbach. Pages › book

Critical Points in a Crystal and Procrystal | SpringerLink

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The critical points in the model electron density distributions of LiF, NaF, NaCl, and MgO crystals, constructed from accurate X-ray diffraction data, are

Influence of different loading stresses on the peak shape of X-ray...

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The behavior of X-ray rocking curves of an austenitic-ferritic duplex stainless steel is investigated in this study. Flat samples were fatigued with different...

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Veröffentlichungen allgemein Ullrich Pietsch

Norm-Minimized Scattering Data from Intensity Spectra

Kinematic light scattering by 3D photonic crystals - SPIE

High-Resolution X-Ray Scattering | Ullrich Pietsch - Springer

Kinematic light scattering by 3D photonic crystals

High-Resolution X-Ray Scattering - SpringerLink

Critical Points in a Crystal and Procrystal | SpringerLink

Influence of different loading stresses on the peak shape of X-ray...